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Academic Journal

Oxides grown on textured single-crystal silicon-dependence on process and application of EEPROMs

  • Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 37(3):583-590 Mar, 1990

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Academic Journal

Channel width effect on MOSFET breakdown

  • Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 39(5):1265-1267 May, 1992

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Academic Journal

High-current snapback characteristics of MOSFETs

  • Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 37(9):2101-2103 Sep, 1990

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